Chinese Bulletin of Botany ›› 2022, Vol. 57 ›› Issue (1): 24-29.DOI: 10.11983/CBB21161

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Advances in Cryo-focused Ion Beam-Scanning Electron Microscopy Imaging Technology

Xing Jia, Fei Sun, Gang Ji()   

  1. Institute of Biophysics, Chinese Academy of Sciences, Beijing 100101, China
  • Received:2021-09-14 Accepted:2021-11-17 Online:2022-01-01 Published:2022-01-17
  • Contact: Gang Ji

Abstract: Cryo-focused ion beam-scanning electron microscopy (Cryo-FIB-SEM) is an emerging technology designed for advanced imaging detection, which performs in situ by combining Cryo-FIB milling and Cryo-SEM imaging, and has facilitated the visualization of the native structures of biological sample in the context of the cellular environment in the frozen hydrated state. In recent years, a series of important advances have been achieved in the application of this technology in the research field of life science. In this review, we summarize its application in cryo-volume serial imaging, and in combination with cryo-correlative light and electron microscopy (CLEM), cryo-transmission SEM (TSEM), cryo-lamella preparation monitoring, and Cryo-SEM image processing. We also provide future prospective on future development and application of Cryo-FIB-SEM in three-dimensional in situ imaging of large volume biological samples.

Key words: cryo-focused ion beam-scanning electron microscopy (Cryo-FIB-SEM), cryo-correlative light and electron microscopy (Cryo-CLEM), cryo-volume serial imaging, cryo-transmission scanning electron microscopy imaging