Advances in Cryo-focused Ion Beam-Scanning Electron Microscopy Imaging Technology
Received date: 2021-09-14
Accepted date: 2021-11-17
Online published: 2021-11-17
Cryo-focused ion beam-scanning electron microscopy (Cryo-FIB-SEM) is an emerging technology designed for advanced imaging detection, which performs in situ by combining Cryo-FIB milling and Cryo-SEM imaging, and has facilitated the visualization of the native structures of biological sample in the context of the cellular environment in the frozen hydrated state. In recent years, a series of important advances have been achieved in the application of this technology in the research field of life science. In this review, we summarize its application in cryo-volume serial imaging, and in combination with cryo-correlative light and electron microscopy (CLEM), cryo-transmission SEM (TSEM), cryo-lamella preparation monitoring, and Cryo-SEM image processing. We also provide future prospective on future development and application of Cryo-FIB-SEM in three-dimensional in situ imaging of large volume biological samples.
Xing Jia, Fei Sun, Gang Ji . Advances in Cryo-focused Ion Beam-Scanning Electron Microscopy Imaging Technology[J]. Chinese Bulletin of Botany, 2022 , 57(1) : 24 -29 . DOI: 10.11983/CBB21161
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